Asia Pacific Digital Inspection Market By Offering (Hardware Solution, Software, Services), Technology (Metrology, Machine Vision, NDT), Dimension (3D, 2D), Vertical (Manufacturing, Electronics and Semiconductor, Energy & Utilities, Oil & Gas, Aerospace & Defense, Food & Pharmaceuticals, Energy & Power, Automotive)
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The Asia Pacific Digital Inspection Market would witness market growth of 8.1% CAGR during the forecast period (2017 - 2023). Digital inspection is a technology that is offering an assured return on investment in the long term, however, the deployment cost of digital inspection systems is very high, making it is a technology that is beyond the reach of some industry minors.
The growing demand for high quality, limited machine downtime, faster setup time, increased productivity, and the need for flexibility in the production of applications such as inspection, measurement, gauging, and assembly verification are some other factors contributing to the growth of the market.
Based on Offering, the Digital Inspection market segments the market into Hardware, Software, and Services. Based on Technology, the market report segments the market into Metrology, Machine Vision, and NDT. Based on Dimension, the Digital Inspection market segments the market into 2D and 3D.
Based on Vertical, the market report segments the market into Manufacturing, Electronics and Semiconductor, Energy & Utilities, Oil & Gas, Aerospace & Defense, Food & Pharmaceuticals, Energy & Power, Automotive, and Others. Based on Countries, the Digital Inspection market segments the market into China, Japan, India, South Korea, Singapore, Malaysia, and Rest of Asia Pacific
The market research report covers the competition analysis of key stakeholders of the Asia Pacific Digital Inspection Market. Key companies profiled in the report include General Electric (GE), Mistras Group, Inc., Olympus Corporation, Hexagon AB, Cognex Corporation, National Instruments Corporation, Roper Technologies (Zetec Inc.), Carl Zeiss AG, Basler AG, and Omron Corporation.